Current Testable Design of Resistor String DACs
Masaki Hashizume, Yutaka Hata, Tomomi Nishida, Hiroyuki Yotsuyanagi, Yukiya Miura · 2007
In this paper, a DFT method of resistor string digital-to-analog converters (DACs) is proposed so as to be tested fully by supply current testing. Targeted defects are opens and shorts in the DACs. Testability of a testable designed DAC is examined experimentally. The results show that shorts and opens in a testable designed DAC will be detected with a smaller number of test vectors by supply current testing.