Intermittent fault coverage during test of electronic components and systems
J. Bicknell · Electronics Letters · 1982
Fault-detection experiments for electronic components and systems are usually designed for the detection of permanent or data-dependent faults. Treatment of intermittent faults in the literature has been restricted to the use of Markov models for the design of fault experiments capable of detecting intermittent faults having specified transition probabilities. In the letter a transformation has been introduced allowing an estimation of the fault coverage of a particular test strategy to be made without assumptions about the characteristics of likely faults.