Some experimental results from random testing of microprocessors
Xavier Fedi, René David · IEEE Transactions on Instrumentation and Measurement · 1986
A random input pattern tester for MC-6800 microprocessors is presented. The tester is based on an efficient input pattern generator which generates the inputs with the required probability distribution. Experimental results are presented. The test length, which is a function of the pattern sequence the moment a faulty output is observed corresponding to the fault in the circuit, is a random variable. The authors illustrate the statistical properties of the test length. Comparisons are made between the deterministic and random experiments and also between the experimental and theoretical results of the random testing.