Method for testable design and for built-in test
P.G. Petrov · 1991
The author proposes a method for testable design and for built-in test based on introduction of a new logical value in logic circuits. It is proved that only one (i) test is needed for detecting all constant multiple s-a-0/1 faults in any combinational (synchronous sequential) circuit where i is maximum sequential depth (MSD) of that circuit.>