Random pattern testing for MCM interconnect using computer generated hologram technology
Chi‐Yuan Chang · 2010
Future computers will need to incorporate the parallelism of optical interconnections in order to achieve projected performance within reasonable size, power, and speed. Optical interconnection provides more advantage than traditional electrical interconnection in large system. In this paper we will propose a Markov model to determine the number of random patterns required for testing of optical interconnect. We describe the random vector to test interconnect and show that a little of random vectors can give close to 100% detection quality. The faults under consideration include stuck-at faults and bridging (short) faults. The simulation results suggest that if the length of boundary scan is large, the traditional method on minimization of test vectors may not lead to a better result. In stead, one should concentrate on choosing the random vector.