Measuring the engagement level of children for multiple intelligence test using Kinect
Dongjin Lee, Woo‐han Yun, Chankyu Park, H.Y. Yoon, Jaehong Kim, Chankyu Park · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2015
In this paper, we present an affect recognition system for measuring the engagement level of children using the Kinect while performing a multiple intelligence test on a computer. First of all, we recorded 12 children while solving the test and manually created a ground truth data for the engagement levels of each child. For a feature extraction, Kinect for Windows SDK provides support for a user segmentation and skeleton tracking so that we can get 3D joint positions of an upper-body skeleton of a child. After analyzing movement of children, the engagement level of children’s responses is classified into two classes: High or Low. We present the classification results using the proposed features and identify the significant features in measuring the engagement.