A cost-based approach to partial scan
Prashant S. Parikh, M. Abramovici · 1993
In this paper, we present a new method for selecting flip-flops for partial scan. Our method ranks all flip-flops based on a sensitivity analysis that determines the improvement in the testability of the circuit as a result of scanning a flip-flop. Testability is computed with respect to a given set of target faults. Our method can estimate the number of scan flip-flops needed to reach a good fault coverage.