Test pattern generation for crosstalk faults considering the gate delay
Noriyoshi Itazaki, Kozo Kinoshita, Hisao Naitoh · Systems and Computers in Japan · 1995
Abstract This paper presents a new method of test pattern generation for detecting crosstalk faults. In general, to detect crosstalk faults, two successive test vectors are needed for exciting and propagating the crosstalk fault. A special signal corresponding to the two successive vectors is designed to simplify the test pattern generation algorithm and its implementation. By taking into consideration gate delay, more accurate test pattern generation can be expected. The algorithm was implemented in a C++ program, and applied to a few benchmark circuits. The experiments show that coverage for large‐scale integrated circuits is at least 70 percent, and for small‐scale integrated circuits up to 90 percent.