LIMSoft: automated tool for sensitivity analysis and test vector generation
Khaled Kamal Saab, David Marche, N.B. Hamida, Bożena Kamińska · IEE Proceedings - Circuits Devices and Systems · 1996
In analogue circuits, deviation in component values causes deviation in the measured output parameters. The relation between the two deviations is the sensitivity function. The paper presents an automated sensitivity analysis tool called LIMSoft, based on the adjoint network method which offers the possibility of DC, AC and transient sensitivity computation. The sensitivity value is then used for soft-fault test vector generation.