HITEST - using knowledge in test generation
Colin Maunder, Ben Bennetts · Computer-Aided Engineering Journal · 1985
HITEST is the first test generation program to capture and use the test engineer's knowledge to allow it to solve the test generation problems caused by complex digital components. The test engineer supplies useful information on the operating modes of component parts of the circuit and HITEST uses this information, together with its innate ability to analyse combinational logic, to allow it to construct test vectors. In case of difficulty - for example, through corrupt or missing data from the test engineer - HITEST interacts with the test engineer to allow the problem to be solved in the most efficient way. This paper describes HITEST and gives examples of its use.