Edge detection with subpixel accuracy
Jack Koplowitz, Xiaobing Lee · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1991
The problem of edge detection in images has been to locate those pixels which contain an edge, i.e., a jump in the intensity level. Recently, a number of researchers have turned their attention to obtaining subpixel accuracy in estimating edge location. This work has generally focused on matching a parametric surface to the region in the image where an edge occurs. In this paper a two-dimensional maximum likelihood approach is used to obtain the most likely position and orientation of the edge. Comparisons show that the maximum likelihood approach gives considerably less error in locating the position of the edge over a wide range of noise conditions and blurring which may be unknown to the estimator.