A Parity Scheme to Enhance Reliability for SSDs
Yi Qin, Dan Feng, Jingning Liu, Wei Tong, Yang Hu, Zhiming Zhu · 2012
Recent years, the application of solid-state disks (SSDs) increases explosively. All SSDs have to employ error correcting code (ECC) technique to ensure the reliability of flash memory at page level. However, data loss may be caused by bad block or chip failure of flash memory. To solve this problem, the article proposes a flash memory redundant array technique, which is similar to RAID-4. In this scheme, we utilize built-in NVRAM to cache the parity data update for minimal write to flash memory in parity channel.