CED for Involutional Functions of PP-1 Cipher
Ewa Idzikowska · 2010
Concurrent Error Detection (CED) for cryptographic chips is very important for detecting fault injection attacks, where faults are injected into chip to break the key. Concurrent Error Detection (CED) techniques based on hardware or time redundancy are widely used to enhance system dependability. In this paper we focus on time redundancy CED techniques targeting involutional functions. We analyze the detection of errors in S-boxes and permutation P of the PP-1 block cipher, designed for platforms with very limited resources. This CED technique can detect both permanent and transient faults with very small time overhead. Simulation results are compared to one of parity based CED schema.