A prototype of a wireless-based test system
Jing-Jia Liou, Chih-Tsun Huang, Cheng‐Wen Wu, Ching-Cheng Tien, Chi-Hu Wang, Hsi‐Pin Ma, Ying-Yen Chen, Yueh-Chih Hsu, Liming Deng, C.T. Chiu, Y. Y. Li, Chieh‐Ming J. Chang · 2007
In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.