Metrology and 1/fnoise: linear regressions and confidence intervals in flicker noise context
F Vernotte, E Lantz · Metrologia · 2015
1/ f noise is very common but is difficult to handle in a metrological way. After having recalled the main characteristics of a strongly correlated noise, this paper will determine relationships giving confidence intervals over the arithmetic mean and the linear drift parameters. A complete example of processing of an actual measurement sequence affected by 1/ f noise will be given.