Local Memory for a High-Speed Digital Test System
Thomas S. Bush · IEEE Transactions on Instrumentation and Measurement · 1977
The choice of RAM or SR memory as local memory dictates many of the characteristics of a high-speed digital test system. This paper examines the impact of the choice on test program efficiency, test speed, and system cost. Understanding this impact is important to anyone testing PC boards containing dynamic LSI devices, such as microprocessors.