Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]
Alberto Pasquini, Adalberto Nobiato Crespo, P. Matrella · IEEE Transactions on Reliability · 1996
This paper investigates: 1) the sensitivity of reliability-growth models to errors in the estimate of the operational profile (OP); and 2) the relation between this sensitivity and the testing accuracy for computer software. The investigation is based on the results of a case study in which several reliability-growth models are applied during the testing phase of a software system. The faults contained in the system are known in advance; this allows measurement of the software reliability-growth and comparison with the estimates provided by the models. Measurement and comparison are repeated for various OPs, thus giving information about the effect of a possible error in the estimate of the OP. The results show that: 1) the predictive accuracy of the models is not heavily affected by errors in the estimate of the OP; and 2) this relation depends on the accuracy with which the software system has been tested.