Microprocessor I/sub DDQ/ testing: a case study
D.D. Josephson, Mark Storey, Doug Dixon · IEEE Design & Test of Computers · 1995
The author describe their incorporation of I/sub DDQ/ testing into the design of the PA-7100LC PA-RISC microprocessor. They also discuss design guidelines, measurement techniques, results after fabrication and volume production, and suggested improvement. Their 900,000-transistor custom design supports I/sub DDQ/ testing to ensure high quality without compromising 100-MHz-plus performance.>