Ellipse sampling for Monte Carlo applications
C.M. Wang, N.C. Hwang, Yuan‐Yu Tsai, Chung‐Hsien Chang · Electronics Letters · 2004
A novel ellipse sampling technique is presented. The technique is efficient, stratified, low distortion and works for both polar and concentric maps between a square and an ellipse. The technique preserves adjacency and fractional area, does not require any numerical computation and has proven to be feasible in Monte Carlo applications.