A data compression technique for built-in self-test
Sudhakar M. Reddy, Kewal K. Saluja, Mark G. Karpovsky · IEEE Transactions on Computers · 1988
A data compression technique called self-testable and error-propagating space compression is proposed and analyzed. Faults in a realization of Exclusive-OR and Exclusive-NOR gates are analyzed, and the use of these gates in the design of self-testing and error propagating space compressors is discussed. It is argued that the proposed data-compression technique reduce the hardware complexity in built-in self-test (BIST) logic designs using external tester environments.>