Extraction of transceiver die pin capacitance using S-parameter de-embedding technique with distributed circuit modeling
Lai Lip Chyuan, Low Hoon Ngik, Hong Shi · 2011
This paper discusses the characterization of bare die transceivers capacitance using return loss measurement from Vector Network Analyzer. The die transceivers capacitance is extracted from the return loss measurement using de-embedding techniques [1] with distributed circuit modeling. An equivalent distributed circuit of the transceiver was modeled and the simulation results of the model were compared with the extracted measurement results. The die pin capacitance was then extracted based on measurements and simulated results.