A pattern for reconstructing test code based on test coverage
Kazunori Sakamoto, Hironori Washizaki, Takuto Wada, Yoshiaki Fukazawa · 2010
The duplicated test code exists widely in source code. However duplicated test code decreases maintainability. We therefore extract and propose a pattern for reconstructing test code to remove the duplication. The pattern finds duplicated test code based on test coverage and helps to remove redundant test code. We contribute to advancement and the spread of the test technology by describing the pattern.