Variability-Aware Parametric Yield Estimation for Analog/Mixed-Signal Circuits: Concepts, Algorithms, and Challenges
Fang Gong, Hao Yu, Yiyu Shi, Lei He · IEEE Design and Test · 2014
Accurate yield estimation is always an important director of design. For analog/mixed signal circuits, the dominant yield loss mechanisms are parametric in nature. This paper provides an informative discussion of varied approaches to parametric yield estimation, including recently developed methods that provide a highly accurate and fast alternative to Monte Carlo methods for some types of analysis.