Elliptic arc discrimination using conjugate diameter of chord
Katsumi Mori, Eiji Watanabe, Shigekazu Katagiri · Systems and Computers in Japan · 2001
Abstract There are many solids of revolution in our surroundings. Since they have elliptic outlines, discriminating elliptic arcs is an important technique for recognizing objects. The presence of diameters is a significant property of ellipses and has been effectively used in many methods of recognizing ellipses. However, the property is not valuable in discriminating short elliptic arcs because diameters are meaningless for short arcs. This paper proposes a method of discriminating elliptic arcs using two parallel scanning lines to a conjugate diameter of a chord. The method requires accurate determination of the conjugate diameter. First, the procedure of binary searching for the conjugate diameter will be established. Next, the method is tested on a real image to prove its validity. Finally, tolerance to noise and sensitivity to deformations of the method will be evaluated. © 2001 Scripta Technica, Syst Comp Jpn, 32(13): 1–13, 2001