Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis
Manish Sharma, Chris Schuermyer, Brady Benware · IEEE Design & Test of Computers · 2009
The cost and cycle time for determining the root cause of yield loss continues to increase as semiconductor technology scales down. A new technique, Axiom, helps yield and product engineers determine the root cause of loss directly from diagnosis results. Consequently, root-cause cycle time is dramatically reduced, resulting in a higher physical-failure analysis success rate and reduced costs.