Testing method for CDs
Yi Zhang, Yuchang Lu, Duanyi Xu, Longfa Pan · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998
This paper provides a method to test some parameters of CDs. These parameters show the quality of the disks directly. The method is based on a commercial CD-ROM and a common computer. Some necessary circuits and software are added in. The analytic results can be provided.