Automating IEEE 1500 Core Test—An EDA Perspective
Krishna Chakravadhanula, Vivek Chickermane · IEEE Design & Test of Computers · 2009
Standardized design and test practices enable automation. This article describes a methodology and corresponding tool set that combines automated support for IEEE Std 1500 and test data compression in one. In this article, we also provide some solutions to the problem of migrating core test patterns to the SoC design.