A novel methodology for robustness analysis of QCA circuits
Dayane Alfenas Reis, Frank Sill Torres · 2015
Although QCA (Quantum-dot Cellular Automata) is a promising nanotechnology to replace CMOS (Complementary Metal-Oxide-Semiconductor), it has several known reliability problems. Consequently, the design of robust QCA circuits is a mandatory step towards the consolidation of this new technology. This paper presents a novel methodology for error analysis of QCA circuits based on deterministic and random insertion of possible defects. Further features are an evaluation of circuit robustness and identification of the most susceptible design elements. Simulation results indicate the feasibility of this novel methodology and reveal starting-points for robustness improvements of known QCA structures.