On generation of a universal path candidate set containing testable long paths
Zijian He, Tao Lv, Huawei Li, Xiaowei Li · 2010
We propose an efficient algorithm on generation of a universal path candidate set U that contains testable long paths for delay testing. Some strategies are presented to speed up the depth-first search procedure of U generation, targeting the reduction of checking times of sensitization criteria. Experimental results illustrate that our approach achieves an 8X speedup on average in comparison with the traditional depth-first search approach.