Joint design and test consideration in high frequency circuits
Iboun-Taimiya Sylla, Mustapha Slamani, Bożena Kamińska, Fadhel M. Ghannouchi · Microwave and Optical Technology Letters · 1997
Radiofrequency (RF) systems technology is continually pushing maximum operating frequencies upward. This constrains manufacturers of RF products to specify their circuits in terms of scattering parameters. Integrating design and test is one of the highly desirable analog systems requirements. In this paper, a frequency domain analysis of RF systems is performed. This analysis is intended to ameliorate the design performances and to facilitate the test of a given product especially integrated circuits. It helps a design engineer to determine parameters that influence the circuit performance and the best topology that can be used to help improve this performance. On the other hand, it helps a test engineer to plan test strategy and to predict which elements can be isolated by a given test set. By this analysis, we determine the correlation between the different components in a circuit and their conjoint influence on the output. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 16: 132–138, 1997.