Broweret al. reply
David L. Brower, Chengwei Yu, R. V. Bravenec, H. Lin, Neville C. Luhmann, W. A. Peebles, Ch. P. Ritz, B.A. Smith, Alan J. Wootton, Z. M. Zhang, S. J. Zhao · Physical Review Letters · 1992
The authors reply to the comment on confinement degradation and enhanced microturbulence as long-time precursors to high-density-limit text device disruptions.The phenomenological model described in the comment(1) represents a novel interpretation of the long-time precursors to high-density-limit disruptions on TEXT. (AIP)