On the Implementation of an Analog ATPG: The Linear Case
Chin‐Long Wey, Richard E. Saeks · IEEE Transactions on Instrumentation and Measurement · 1985
A self-testing algorithm in which post-test simulation with failure bounds is employed, has been proposed. Based on this self-testing algorithm, an analog Automatic Test Program Generation (ATPG) for linear circuits or systems is being developed. The AATPG code is subdivided into off-line and on-line components while the actual test can be run in either a fully automatic mode or interactively.