The test methods for some failure modes of 1K MOS RAM
Koji Kodama, Yujiro Kasai · 1974
There are many failure modes in 1103 type MOS RAM'S. Some chips have very unique and unfamiliar failure modes. These chips pass both shipping and incoming tests but often fail at the memory system test and significantly decrease the reliability of the system. To eliminate these chips and improve the reliability, we examined the failure modes of them and found effective test methods. By applying these technologies, we have established the good correlation between the chip test and the system test, and achieved the high reliability of the memory systems.