Test pattern generation in presence of unknown values based on restricted symbolic logic
Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker · 2014
Test generation algorithms based on standard n-valued logic algebras are pessimistic in presence of unknown (X) values, overestimate the number of signals with X-values and underestimate fault coverage.