Time-domain fault diagnosis of analogue circuits in the presence of noise
V. Brygilewicz, Jerzy Wojciechowski · IEE Proceedings - Circuits Devices and Systems · 1998
An approach to multiple fault diagnosis in dynamic linear and nonlinear circuits based on testing of actual and simulation of nominal circuit is presented. Time domain integral sensitivity is used for constructing test equations. An adaptive algorithm for selecting time intervals for integral sensitivity is included. The least squares approach (LSA) to solve overdetermined diagnosis equations with noisy data is used in conjunction with the regularisation method of Tikhonov. Three illustrative examples show applications of the method.