Testability analysis and multi-frequency ATPG for analog circuits and systems
S. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang · 1998
Fast and efficient test generation techniques are key to reducing the current high cost of testing analog circuits. A new multi-frequency test generation technique for detecting catastrophic failures in this class of circuits is presented. Testability transfer factors are introduced and we use them to construct an efficient test set for analog circuits. Fault detectability and fault coverage are also defined. Two circuits from the suite [4] of analog and mixed-signal benchmark circuits are used to validate our approach.