Wavelet transform domain adaptive clustering for electronic product quality inspection
Galina Shcherbakova, Victor Krylov, Radmila Pisarenko, V. K. Kuz'menko · 2013
Wavelet transform (WT) domain adaptive clustering for electronic product quality inspection was suggested in this work. The proposed information technology, based on the multistart adaptive clustering method in the space of the WT, can shorten manufacturing test of products in case of a significant change in these parameters over time, a high noise level and small samples of data.