On coding for 'stuck-at' defects (Corresp.)
J. Martin Borden, A. J. Han Vinck · IEEE Transactions on Information Theory · 1987
Additive linear codes for use on the defect channel--a model for computer memories with stuck-at defects--are studied. Basic properties of both block and convolutional codes are given. Error probabilities are carefully defined and bounded. A reasonably practical convolutional coding scheme is described and simulated. Finally, some codes for a bursty defect channel are described.