A design for testability technique for quantum reversible circuits
Joyati Mondal, Debesh Kumar Das, Dipak Kumar Kole, Hafizur Rahaman · 2013
This paper shows that in a (n×n) reversible circuit implemented with k-CNOT gates, addition of only two extra input lines along with insertion of few k-CNOT gates can yield an easily testable design, which admits a universal test set of size (n+1) to detect all SMGFs, PMGFs, and detectable RGFs in the circuit.