A class of SEC‐DED‐SBED codes for semiconductor memory
Shigeo Kaneda · Systems and Computers in Japan · 1985
Abstract The SEC‐DED‐SbED code is capable of correcting a single‐bit eror, detecting a random double‐bit error and detecting a b‐bit block error. It is expected to be widely used for highly reliable semiconductor memory systems composed of memory devices with b‐bit output. In this paper a new theoretical construction method for SEC‐DED‐SbED codes is proposed. The proposed class of codes is so characterized that, with byte length b, it is constructed from conventional SEC‐DED‐SbED codes of byte length b/2 and the weight of the column vector of its parity check matrix H (the number of l's) is odd. The bit length n of the code is given as n _ b2(r‐b) . r/2Cb/2 bits, when the check bit length r and the byte length b are even. It has the longest bit length among the known code classes in a large range of byte lengths.