A Semiautomatic Integrating Densitometer with Digital Readout for One Dimensional X-Ray Diffraction Films
W. E. Keefe, Ray C Williams, W. T. Ham, John Stewart · Review of Scientific Instruments · 1970
A technique is described whereby the density of diffraction spots on unidimensional x-ray film is measured by means of a microdensitometer and recorded on a strip chart recorder; simultaneously, the area under the curve is integrated electronically and the results are displayed on a digital counting device. The data for one structure which has been completed gave a final R value of 0.064.