An Automatic DFT System for the Silc Silicon Compiler
H. S. Fung, Sanford S. Hirschhorn · IEEE Design & Test of Computers · 1986
This article discusses design for testability automation for the Silc silicon compiler under development at GTE Laboratories, Inc. Our modular design for testability uses both built-in self-test and scan-path techniques for Slic's full custom VLSI designs. A test controller coordinates the testing of the chip's modules. Testability evaluation is performed using controllability/observability methods, and using a method based on information theory. A testable-by-construction approach is followed in order to synthesize blocks of testable logic. A testability "expert" manages testability knowledge during the synthesis process and makes the ultimate testability decisions.