Images matching based on edge maps and wavelet transform
Mong-Shu Lee, Mu‐Yen Chen, Dah‐Jing Jwo · 2010 3rd International Congress on Image and Signal Processing · 2010
A structure-based image similarity measurement called DTWT-SSIM is presented. The main idea behind DTWT-SSIM is to combine the shift-invariance advantage of dual-tree wavelet transform (DTWT) with the structure-preserving property of the structural similarity metrics (SSIM). A series of experimental results show the improved measurement to be an effective and stable metric in the comparison of edge maps when small noise and distortion appear in the images.