At-speed scan test with low switching activity
Elham Moghaddam, Janusz Rajski, Mark Kassab, Sudhakar M. Reddy · 2010
This paper presents a novel method to generate test vectors that mimic functional operation from switching activity point of view. The method uses states obtained by applying a number of functional clock cycles starting from the scan-in state of a test vector to fill the unspecified scan cell values in test cubes. Experimental results presented for industrial circuits demonstrate the effectiveness of the proposed method.