Instrumentation: Automated board testing: Coping with complex circuits: As printed circuit boards become harder to test due to VLSI components, automated systems and new design techniques are coming to the rescue
Rodham E. Tulloss · IEEE Spectrum · 1983
As printed-circuit boards become harder to test due to VLSI components, automated systems and new design techniques are coming to the rescue. The author outlines the use of automatic test equipment (ATE).