BIST Structure for ASIC Circuits
Ireneusz Gościniak · 2006
The paper presents the possibility to use linear modification to build the testing structure for the ASIC SC and GA mask programmable circuits. The proposed conception was verified by simulating research of proposed testing structure using ISCAS'89 benchmark circuits. The conclusions included in the paper were illustrated by simulating research results of single and multimodular circuits. The proposed method of linear modification is characterised by small circuit overhead and high effectiveness of testing