Data path synthesis for BIST with low area overhead
Xiaowei Li, P.Y.S. Cheung · 1999
This paper presents an attempt towards design quality improvement by incorporating of self-testability features during data path (high-level) synthesis. This method is based on the use of test resource sharing possibilities to improve the self-testability of the circuit. This is achieved by incorporating testability constraints during register assignment. Experimental results are presented to demonstrate the effectiveness of the proposed data path synthesis for BIST approach.