CSI HELSINKI: SWLI IN FORENSIC SCIENCE: COMPARING TOOLMARKS OF DIAGONAL CUTTING PLIERS
Patrik Ahvenainen, Ivan Kassamakov, Kalle Hanhijärvi, Juho Aaltonen, Sami Lehto, Tapani Reinikainen, E. Hæggström, Donald O. Thompson, Dale E. Chimenti · AIP conference proceedings · 2010
Scanning White Light Interferometry provides sub‐micron depth resolution and is therefore an ideal data acquisition method for forensic toolmark comparison in which such resolution is required. We imaged toolmarks made on ten copper wires with a preselected part of the jaws of a pair of diagonal cutting pliers. The common pattern found in the surface depth profiles comparison indicated a common source. The application of white light interferometry provides a quantitative method for forensic toolmark study through high‐resolution 3D profiles.