A Unified Solution to Scan Test Volume, Time, and Power Minimization
Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya · 2010
The double-tree scan-path architecture, originally proposed for low test power, is adapted to simultaneously reduce the test application time and test data volume under external testing. Experimental results show significant performance improvements over other existing scan architectures.