Statistical analysis of multiple intermittent faults in combinational circuits
MOSTAFA H. ABD-EL-BARR, SHAD I. ANSARI · International Journal of Electronics · 1996
Statistical analysis of multiple intermittent faults (SAMIFs) is proposed as a method for estimating the detection probabilities and fault coverage of multiple intermittent faults in combinational circuits. SAMIFs involves the concurrent simulation of multiple intermittent faults and an estimation of the controllability and observability values for each node of the faulty circuit for a given set of input vectors. The controllabilities and observabilities are then used to derive estimates of the fault-detection probabilities and the overall fault coverage. An algorithm for estimating the fault coverage of a pseudo-random test vector set over a set of multiple intermittent faults in a combinational circuit is also proposed. Experimental results obtained from applying the algorithm to a number of benchmark circuits are also presented.